Inspection of freeform surfaces and complex geometry

The new RFP fringe probe is designed for inspection of freeform surfaces and complex geometry, rapidly delivering patches of surface data with a high point density.

The RFP fringe probe makes structured light inspection an integral part of your CMM measurement procedure, increasing the multi-sensor capability of the REVO 5-axis system.

Unlike other non-contact structured light systems, the probe does not require reference markers to stitch together data from different areas, as this is done automatically by the REVO system.

Two software tools enhance the system's usability, providing an easy-to-use inspection planner for path planning and generating DMIS part programs from CAD, and digitiser software to collect data from parts without CAD models as part of a reverse engineering process.

Company

Renishaw

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